X-Ray Diffraction, Scanning Electron Microscopy and Differential Thermal Analysis of (CuGaSe2)1-x(TaSe)x Alloys System (0≤ x ≤0.5)

X-Ray Diffraction, Scanning Electron Microscopy and Differential Thermal Analysis of (CuGaSe2)1-x(TaSe)x Alloys System (0≤ x ≤0.5)

ABSTRACT

Samples belong to the (CuGaSe2)1-x(TaSe)x alloys system were prepared from stoichiometric portions of the constituent elements using the melt and anneal method, in the composition range 0 ≤ x ≤ 0.5. The resulting ingots (8mm diameter and 200mm long) were homogeneous at sight, light gray color, without voids. The characterization was performed using X-Ray Diffraction (XRD), Scanning Electron Microscopy (SEM) and Differential Thermal Analysis (DTA) techniques. XRD diffraction patterns show a chalcopyrite-like phase (analogous to CuGaSe2) in the entire composition range 0≤x≤0.5 and another hexagonal phase, not identified, for 0.3≤x≤0.5. SEM analysis indicated that Ta contents in the chalcopyrite-like phase do not excess 10%, suggesting that this is the limit of solubility. Using the experimental information obtained, a T-x phase diagram has been proposed.

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